automatic test unit

См. также в других словарях:

• Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

• Test — Ein Test ist ein Versuch, mit dem größere Sicherheit darüber gewonnen werden soll, ob ein technischer Apparat oder ein Vorgang innerhalb der geplanten Rahmenbedingungen funktioniert bzw. ob bestimmte Eigenschaften vorliegen oder nicht. Er… …   Deutsch Wikipedia

• Automatic summarization — is the creation of a shortened version of a text by a computer program. The product of this procedure still contains the most important points of the original text. The phenomenon of information overload has meant that access to coherent and… …   Wikipedia

• Automatic dependent surveillance-broadcast — (ADS B) is a cooperative surveillance technique for air traffic control and related applications. An ADS B out equipped aircraft determines its own position using a global navigation satellite system and periodically broadcasts this position and… …   Wikipedia

• Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

• Automatic transmission — An automatic transmission (commonly AT or Auto ) is an automobile gearbox that can change gear ratios automatically as the vehicle moves, freeing the driver from having to shift gears manually. Similar but larger devices are also used for heavy… …   Wikipedia

• Automatic number announcement circuit — An automatic number announcement circuit (ANAC) is a special telephone number that is meant to be used by phone company technicians and other telecommunications technicians to determine the phone number of a particular line. The way an ANAC works …   Wikipedia

• Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… …   Wikipedia

• Source-Measurement-Multiplex-Unit — Eine SMU ist ein Multifunktionsgerät, das sowohl im Elektronik Labor als auch in der Produktion (als Automatic Test Equipment (ATE)) eingesetzt wird. Je nach Hersteller steht die Abkürzung für Source Measurement Unit oder Source Meter Unit. SMUs… …   Deutsch Wikipedia

• Abbreviated Test Language for All Systems — (ATLAS) is a MILSPEC language for automatic testing of avionics equipment. It is a high level computer language and can be used on any computer whose supporting software can translate it into the appropriate low level instructions.HistoryThe… …   Wikipedia

• Device under test — (DUT), also known as unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing. In semiconductor testing In semiconductor testing, DUT refers to a specific die on a wafer or the resulting packaged part.… …   Wikipedia